Yi Zhang, Hong-fei Zhang, Jian-min Wang, Yi Feng, Cheng Chen, Zi-ang Wang, Qi-jie Tang, Guang-yu Zhang +1
Abstract
In this paper, we introduce a general scientific CCD simulation and test system which can meet the test requirements of different types of CCD chips from E2V company, such as measuring different signals output from modules of a CCD controller including power supply, fan, temperature control module, crystal oscillator, shutter and clock-bias generator. Furthermore, the video signal of the CCD detector can be simulated and superimposed with random noise to verify the performance of the video sampling circuit of the CCD controller. The simulation and test system was successful used for the CCD controller which was designed for E2V CCD47-20 detector.