Coherence resonance in an unijunction transistor relaxation oscillator

Abstract

The phenomenon of coherence resonance (CR) is investigated in an unijunction transistor relaxation oscillator (UJT-RO) and quantified by estimating the normal variance (NV). Depending upon the measuring points two types of NV curves have been obtained. We have observed that the degradations in coherency at higher noise amplitudes in our system is probably the result of direct interference of coherent oscillations and the stochastic perturbation. Degradation of coherency may be minimal if this direct interference of noise and coherent oscillations is eliminated.